| タイトル | 4H-SiC UV Photo Detector with Large Area and Very High Specific Detectivity |
| 本文（外部サイト） | http://hdl.handle.net/2060/20040082193 |
| 著者（英） | Zhao, Jian H.; Shahid, Aslam; Yan, Feng; Winer, Maurice; Xin, Xiaobin; Zhao, Yuegang; Franz, David |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2004-01-01
2004 |
| 言語 | eng |
| 内容記述 | Pt/4H-SiC Schottky photodiodes have been fabricated with the device areas up to 1 sq cm. The I-V characteristics and photo-response spectra have been measured and analyzed. For a 5 mm x 5 mm area device leakage current of 1 x 10(exp 15)A at zero bias and 1.2 x 10(exp 14)A at -IV have been established. The quantum efficiency is over 30% from 240nm to 320nm. The specific detectivity, D(sup *), has been calculated from the directly measured leakage current and quantum efficiency data and are shown to be higher than 10(exp 15) cmHz(sup 1/2)/W from 210nm to 350nm with a peak D(sup *) of 3.6 x 10(exp 15)cmH(sup 1/2)/W at 300nm. |
| NASA分類 | Instrumentation and Photography |
| 権利 | Copyright, Distribution as joint owner in the copyright |
