| タイトル | Evaluation of an Ultra-Low Power Reed Solomon Encoder for NASA's Space Technology 5 Mission |
| 本文（外部サイト） | http://hdl.handle.net/2060/20030112385 |
| 著者（英） | Gambles, J.; Hass, J.; Xapsos, M. A.; Murguia, J.; Yeh, P-S.; Maki, G.; LaBel, K. A.; Lei, K. E.; Poivey, C.; Stone, R. F. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2003-01-01 |
| 言語 | eng |
| 内容記述 | Radiation test results and analyses are presented for ultra-low power Reed Solomon encoder circuits that are being considered for use on the Space Technology 5 (ST5) mission. The total ionizing dose tolerance is in excess of 100 krad(Si) and is due to the low supply voltage and the use of back-bias, which suppresses radiation-induced leakage currents in the n-channel devices. The circuits do not latch-up for ion LET values of at least 90 MeV-sq cm/mg. A hardened-by-design approach to SEU has achieved an upset threshold of about 20 MeV-sq cm/mg. The SEU rate expected for these circuits in the geosynchronous transfer orbit of ST5 is low. |
| NASA分類 | Electronics and Electrical Engineering |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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