| タイトル | High-Sensitivity X-ray Polarimetry with Amorphous Silicon Active-Matrix Pixel Proportional Counters |
| 本文（外部サイト） | http://hdl.handle.net/2060/20030095994 |
| 著者（英） | Street, R. A.; Deines-Jones, P.; Jahoda, K.; Ready, S. E.; Black, J. K. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2003-01-01 |
| 言語 | eng |
| 内容記述 | Photoelectric X-ray polarimeters based on pixel micropattern gas detectors (MPGDs) offer order-of-magnitude improvement in sensitivity over more traditional techniques based on X-ray scattering. This new technique places some of the most interesting astronomical observations within reach of even a small, dedicated mission. The most sensitive instrument would be a photoelectric polarimeter at the focus of 2 a very large mirror, such as the planned XEUS. Our efforts are focused on a smaller pathfinder mission, which would achieve its greatest sensitivity with large-area, low-background, collimated polarimeters. We have recently demonstrated a MPGD polarimeter using amorphous silicon thin-film transistor (TFT) readout suitable for the focal plane of an X-ray telescope. All the technologies used in the demonstration polarimeter are scalable to the areas required for a high-sensitivity collimated polarimeter. Leywords: X-ray polarimetry, particle tracking, proportional counter, GEM, pixel readout |
| NASA分類 | Instrumentation and Photography |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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