| タイトル | Single-Event Effects Ground Testing and On-Orbit Rate Prediction Methods: The Past, Present and Future |
| 本文（外部サイト） | http://hdl.handle.net/2060/20030053172 |
| 著者（英） | Pickel, Jim; Reed, Robert A.; Kinnison, Jim; Kniffin, Scott; Buchner, Stephen; Marshall, Paul W.; LaBel, Kenneth A. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2003-01-01 |
| 言語 | eng |
| 内容記述 | Over the past 27 years, or so, increased concern over single event effects in spacecraft systems has resulted in research, development and engineering activities centered around a better understanding of the space radiation environment, single event effects predictive methods, ground test protocols, and test facility developments. This research has led to fairly well developed methods for assessing the impact of the space radiation environment on systems that contain SEE sensitive devices and the development of mitigation strategies either at the system or device level. |
| NASA分類 | Space Radiation |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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