| タイトル | Current Single Event Effects and Radiation Damage Results for Candidate Spacecraft Electronics |
| 本文（外部サイト） | http://hdl.handle.net/2060/20030025415 |
| 著者（英） | OBryan, Martha V.; Kniffin, Scott D.; Titus, Jeff L.; Bings, John P.; Buchner, Stephen P.; Ladbury, Ray L.; Reed, Robert A.; LaBel, Kenneth A.; Howard, James W., Jr.; Poivey, Christian |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2002-01-01 |
| 言語 | eng |
| 内容記述 | We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, total ionizing dose and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others. |
| NASA分類 | Spacecraft Instrumentation and Astrionics |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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