| タイトル | Logic Design Pathology and Space Flight Electronics |
| 本文（外部サイト） | http://hdl.handle.net/2060/20000033627 |
| 著者（英） | Katz, Richard; Erickson, K.; Barto, Rod L. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 1997-01-01 |
| 言語 | eng |
| 内容記述 | Logic design errors have been observed in space flight missions and the final stages of ground test. The technologies used by designers and their design/analysis methodologies will be analyzed. This will give insight to the root causes of the failures. These technologies include discrete integrated circuit based systems, systems based on field and mask programmable logic, and the use computer aided engineering (CAE) systems. State-of-the-art (SOTA) design tools and methodologies will be analyzed with respect to high-reliability spacecraft design and potential pitfalls are discussed. Case studies of faults from large expensive programs to "smaller, faster, cheaper" missions will be used to explore the fundamental reasons for logic design problems. |
| NASA分類 | Quality Assurance and Reliability |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/227305 |
