タイトル | High T(sub c) Superconducting Bolometer on Chemically Etched 7 Micrometer Thick Sapphire |
本文(外部サイト) | http://hdl.handle.net/2060/20000032805 |
著者(英) | Cushman, G. M.; Pique, A.; Babu, S.; Brasunas, J. C.; Lakew, B.; Mott, B.; Fettig, R. |
著者所属(英) | NASA Goddard Space Flight Center |
発行日 | 1997-01-01 |
言語 | eng |
内容記述 | A transition-edge IR detector, using a YBa2Cu3O(7-x) (YBCO) thin film deposited on a chemically etched, 7 micrometer thick sapphire substrate has been built. To our knowledge it is the first such high T(sub c) superconducting (HTS) bolometer on chemically thinned sapphire. The peak optical detectivity obtained is l.2 x 10(exp 10) cmHz(sup 1/2)/W near 4Hz. Result shows that it is possible to obtain high detectivity with thin films on etched sapphire with no processing after the deposition of the YBCO film. We discuss the etching process and its potential for micro-machining sapphire and fabricating 2-dimensional detector arrays with suspended sapphire membranes. A 30 micrometer thick layer of gold black provided IR absorption. Comparison is made with the current state of the art on silicon substrates. |
NASA分類 | Instrumentation and Photography |
権利 | No Copyright |
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