| タイトル | Overview of the systems special investigation |
| 著者（英） | Edelman, Joel; Mason, James B.; Dursch, Harry |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 1992-06-01 |
| 言語 | eng |
| 内容記述 | The Systems Special Investigation Group (SIG), formed by the Long Duration Exposure Facility (LDEF) Project Office to perform post flight analysis of systems hardware, was chartered to investigate the effects of the extended LDEF mission on both satellite and experiment systems and to coordinate and integrate all systems analysis performed in post flight investigations. Almost all of the top level functional testing of the active experiments has been completed, but many components are still under investigation by either the Systems SIG or individual experimenters. Results reported to date have been collected and integrated by the Systems SIG and an overview of the current results and the status of the Systems Investigation are presented in this paper. |
| NASA分類 | NONMETALLIC MATERIALS |
| レポートNO | 92N27303 |
| 権利 | No Copyright |
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