| タイトル | LDEF electronic systems: Successes, failures, and lessons |
| 著者（英） | Mulkey, Owen; Levorsen, Joe; Brooks, Larry; Porter, Dave; Miller, Emmett; Smith, Dave |
| 著者所属（英） | Boeing Aerospace and Electronics Co. |
| 発行日 | 1991-06-01 |
| 言語 | eng |
| 内容記述 | Following the Long Duration Exposure Facility (LDEF) retrieval, the Systems Special Investigation Group (SIG) participated in an extensive series of tests of various electronic systems, including the NASA provided data and initiate systems, and some experiment systems. Overall, these were found to have performed remarkably well, even though most were designed and tested under limited budgets and used at least some nonspace qualified components. However, several anomalies were observed, including a few which resulted in some loss of data. The postflight test program objectives, observations, and lessons learned from these examinations are discussed. All analyses are not yet complete, but observations to date will be summarized, including the Boeing experiment component studies and failure analysis results related to the Interstellar Gas Experiment. Based upon these observations, suggestions for avoiding similar problems on future programs are presented. |
| NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
| レポートNO | 91N25085 |
| 権利 | No Copyright |
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