| タイトル | Chemical characterization of selected LDEF polymeric materials |
| 著者（英） | Young, Philip R.; Slemp, Wayne S. |
| 著者所属（英） | NASA Langley Research Center |
| 発行日 | 1991-06-01 |
| 言語 | eng |
| 内容記述 | Chemical characterization of selected polymeric materials which received exposure on the Long Duration Exposure Facility (LDEF) is reported. The specimens examined include silvered fluorinated ethylene propylene Teflon thermal blanket material, polysulfone, epoxy, polyimide matrix resin/graphite fiber reinforced composites, and several high performance polymer films. These specimens came from numerous LDEF locations, and thus received different environmental exposures. The results to date show no significant change at the molecular level in the polymer that survived exposure. Scanning electron and scanning tunneling microscopes show resin loss and a texturing of some specimens which resulted in a change in optical properties. The potential effect of a silicon-containing molecular contamination on these materials is addressed. The possibility of continued post-exposure degradation of some polymeric films is also proposed. |
| NASA分類 | NONMETALLIC MATERIALS |
| レポートNO | 91N25019 |
| 権利 | No Copyright |
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