| タイトル | Tin Whisker Electrical Short Circuit Characteristics |
| 本文（外部サイト） | http://hdl.handle.net/2060/20130010969 |
| 著者（英） | Courey, Karim J.; Bayliss, Jon A.; Wright, Maria C.; Asfour, Shihab S.; Ludwig, Lawrence L.; Onar, Arzu |
| 著者所属（英） | NASA Kennedy Space Center |
| 発行日 | 2009-01-01 |
| 言語 | eng |
| 内容記述 | Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that has an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage. In addition, the unexpected polycrystalline structure seen in the focused ion beam (FIB) cross section in the first experiment was confirmed in this experiment using transmission electron microscopy (TEM). The FIB was also used to cross section two card guides to facilitate the measurement of the grain size of each card guide's tin plating to determine its finish. |
| NASA分類 | Electronics and Electrical Engineering |
| レポートNO | KSC-2008-137R |
| 権利 | Copyright, Distribution as joint owner in the copyright |
|
