| タイトル | Detecting Nanophase Weathering Products with CheMin: Reference Intensity Ratios of Allophane, Aluminosilicate Gel, and Ferrihydrite |
| 本文（外部サイト） | http://hdl.handle.net/2060/20130010051 |
| 著者（英） | Vaniman, D. T.; Anderson, R. C.; Bish, D. L.; Bristow, T. F.; Treiman, A. H.; Morookian, J. M.; Yen, A. S.; Achilles, C. N.; DesMarais, D. J.; Sarrazin, P.; Morris, R. V.; Blake, D. F.; Chipera, S. J.; Morrison, S. M.; Crisp, A.; Stolper, E. M.; Downs, R. T.; Spanovich, N.; Ming, D W.; Farmer, J. D.; Rampe, E. B. |
| 著者所属（英） | NASA Johnson Space Center |
| 発行日 | 2013-01-01 |
| 言語 | eng |
| 内容記述 | X-ray diffraction (XRD) data collected of the Rocknest samples by the CheMin instrument on Mars Science Laboratory suggest the presence of poorly crystalline or amorphous materials [1], such as nanophase weathering products or volcanic and impact glasses. The identification of the type(s) of X-ray amorphous material at Rocknest is important because it can elucidate past aqueous weathering processes. The presence of volcanic and impact glasses would indicate that little chemical weathering has occurred because glass is highly susceptible to aqueous alteration. The presence of nanophase weathering products, such as allophane, nanophase iron-oxides, and/or palagonite, would indicate incipient chemical weathering. Furthermore, the types of weathering products present could help constrain pH conditions and identify which primary phases altered to form the weathering products. Quantitative analysis of phases from CheMin data is achieved through Reference Intensity Ratios (RIRs) and Rietveld refinement. The RIR of a mineral (or mineraloid) that relates the scattering power of that mineral (typically the most intense diffraction line) to the scattering power of a separate mineral standard such as corundum [2]. RIRs can be calculated from XRD patterns measured in the laboratory by mixing a mineral with a standard in known abundances and comparing diffraction line intensities of the mineral to the standard. X-ray amorphous phases (e.g., nanophase weathering products) have broad scattering signatures rather than sharp diffraction lines. Thus, RIRs of X-ray amorphous materials are calculated by comparing the area under one of these broad scattering signals with the area under a diffraction line in the standard. Here, we measured XRD patterns of nanophase weathering products (allophane, aluminosilicate gel, and ferrihydrite) mixed with a mineral standard (beryl) in the CheMinIV laboratory instrument and calculated their RIRs to help constrain the abundances of these phases in the Rocknest samples. |
| NASA分類 | Space Sciences (General) |
| レポートNO | JSC-CN-27875 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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