タイトル | Compendium of Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA |
本文(外部サイト) | http://hdl.handle.net/2060/20120015010 |
著者(英) | Chen, Dakai; Boutte, Alvin J.; Casey, Megan C.; Lauenstein, Jean-Marie; Wilcox, Edward P.; Ladbury, Raymond L.; Oldham, Timothy R.; LaBel, Kenneth A.; Obryan, Martha V.; Cochran, Donna J.; Pellish, Jonathan A.; Campola, Michael J.; Batchlor, David A. |
著者所属(英) | NASA Goddard Space Flight Center |
発行日 | 2012-07-16 |
言語 | eng |
内容記述 | Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear, and hybrid devices. |
NASA分類 | Spacecraft Instrumentation and Astrionics |
レポートNO | GSFC.ABS.6990.2012 |
権利 | Copyright, Distribution as joint owner in the copyright |
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