| タイトル | A Portable, High Resolution, Surface Measurement Device |
| 本文（外部サイト） | http://hdl.handle.net/2060/20120006139 |
| 著者（英） | Youngquist, Robert C.; Burns, Bradley M.; Ihlefeld, Curtis M. |
| 著者所属（英） | NASA Kennedy Space Center |
| 発行日 | 2012-01-01 |
| 言語 | eng |
| 内容記述 | A high resolution, portable, surface measurement device has been demonstrated to provide micron-resolution topographical plots. This device was specifically developed to allow in-situ measurements of defects on the Space Shuttle Orbiter windows, but is versatile enough to be used on a wide variety of surfaces. This paper discusses the choice of an optical sensor and then the decisions required to convert a lab bench optical measurement device into an ergonomic portable system. The necessary trade-offs between performance and portability are presented along with a description of the device developed to measure Orbiter window defects. |
| NASA分類 | Spacecraft Design, Testing and Performance |
| レポートNO | KSC-2012-060 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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