| タイトル | Single Event Effects (SEE) Testing of Embedded DSP Cores within Microsemi RTAX4000D Field Programmable Gate Array (FPGA) Devices |
| 本文（外部サイト） | http://hdl.handle.net/2060/20110023387 |
| 著者（英） | Berg, Melanie D.; Perez, Christopher E.; Friendlich, Mark R. |
| 著者所属（英） | MEI Technologies, Inc. |
| 発行日 | 2011-08-22 |
| 言語 | eng |
| 内容記述 | Motivation for this work is: (1) Accurately characterize digital signal processor (DSP) core single-event effect (SEE) behavior (2) Test DSP cores across a large frequency range and across various input conditions (3) Isolate SEE analysis to DSP cores alone (4) Interpret SEE analysis in terms of single-event upsets (SEUs) and single-event transients (SETs) (5) Provide flight missions with accurate estimate of DSP core error rates and error signatures. |
| NASA分類 | Electronics and Electrical Engineering |
| レポートNO | GSFC.CPR.5122.2011 |
| 権利 | Copyright, Distribution under U.S. Government purpose rights |
