| タイトル | Metrology of IXO Mirror Segments |
| 本文（外部サイト） | http://hdl.handle.net/2060/20110022519 |
| 著者（英） | Chan, Kai-Wing |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2011-08-21 |
| 言語 | eng |
| 内容記述 | For future x-ray astrophysics mission that demands optics with large throughput and excellent angular resolution, many telescope concepts build around assembling thin mirror segments in a Wolter I geometry, such as that originally proposed for the International X-ray Observatory. The arc-second resolution requirement posts unique challenges not just for fabrication, mounting but also for metrology of these mirror segments. In this paper, we shall discuss the metrology of these segments using normal incidence metrological method with interferometers and null lenses. We present results of the calibration of the metrology systems we are currently using, discuss their accuracy and address the precision in measuring near-cylindrical mirror segments and the stability of the measurements. |
| NASA分類 | Astrophysics |
| レポートNO | GSFC.CPR.5166.2011 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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