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タイトルOptical Manufacturing and Testing Requirements Identified by the NASA Science Instruments, Observatories and Sensor Systems Technology Assessment
本文(外部サイト)http://hdl.handle.net/2060/20110015792
著者(英)Mcleese, Dan; Feinberg, Lee; Bauman, Jill; Stahl, H. Philip; Barney, Rich; Singh, Upendra
著者所属(英)NASA Marshall Space Flight Center
発行日2011-08-21
言語eng
内容記述In August 2010, the NASA Office of Chief Technologist (OCT) commissioned an assessment of 15 different technology areas of importance to the future of NASA. Technology assessment #8 (TA8) was Science Instruments, Observatories and Sensor Systems (SIOSS). SIOSS assess the needs for optical technology ranging from detectors to lasers, x-ray mirrors to microwave antenna, in-situ spectrographs for on-surface planetary sample characterization to large space telescopes. The needs assessment looked across the entirety of NASA and not just the Science Mission Directorate. This paper reviews the optical manufacturing and testing technologies identified by SIOSS which require development in order to enable future NASA high priority missions.
NASA分類Optics
レポートNOM11-0906
M11-0894
M11-0450
権利No Copyright


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