| タイトル | Radiation Status of Sub-65 nm Electronics |
| 本文（外部サイト） | http://hdl.handle.net/2060/20110015457 |
| 著者（英） | Pellish, Jonathan A. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2011-06-28 |
| 言語 | eng |
| 内容記述 | Ultra-scaled complementary metal oxide semiconductor (CMOS) includes commercial foundry capabilities at and below the 65 nm technology node Radiation evaluations take place using standard products and test characterization vehicles (memories, logic/latch chains, etc.) NEPP focus is two-fold: (1) Conduct early radiation evaluations to ascertain viability for future NASA missions (i.e. leverage commercial technology development). (2) Uncover gaps in current testing methodologies and mechanism comprehension -- early risk mitigation. |
| NASA分類 | Electronics and Electrical Engineering |
| レポートNO | GSFC.OVPR.4710.2011 |
| 権利 | No Copyright |
