| タイトル | Investigation of Current Spike Phenomena During Heavy Ion Irradiation of NAND Flash Memories |
| 本文（外部サイト） | http://hdl.handle.net/2060/20110015262 |
| 著者（英） | Mavis, David G.; McMorrow, Dale; Oldham, Timothy R.; LaBel, Kenneth A.; Wilcox, Ted; Irom, Farokh; Seidleck, Christina; Berg, Melanie; Friendlich, Mark; Castillo, James; Buchner, Steven P.; Eaton, Paul H. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2011-07-27 |
| 言語 | eng |
| 内容記述 | A series of heavy ion and laser irradiations were performed to investigate previously reported current spikes in flash memories. High current events were observed, however, none matches the previously reported spikes. Plausible mechanisms are discussed. |
| NASA分類 | Electronics and Electrical Engineering |
| レポートNO | GSFC.CP.4957.2011
NSREC 2011 - Oldham W-25 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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