AIREX: Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

タイトル	Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
本文（外部サイト）	http://hdl.handle.net/2060/20110015231
著者（英）	Phan, Anthony M.; Irom, Farokh; Oldham, Timothy R.; Salzman, James F.; Ladbury, Ray L.; Sanders, Anthony B.; Satterfield, Harold W.; Buchner, Stephen P.; LaBel, Kenneth A.; Carts, Martin A.; O'Bryan, Martha V.; Kim, Hak S.; Berg, Melanie; Thomson, Eric T.; Marshall, Paul; Pearce, Larry G.; Bernard, Theju M.; Lauenstein, Jean-Marie; Chen, Dakai; Burns, Sam; Marshall, Cheryl; Xapsos, Michael A.; Pellish, Jonathan A.; Williams, Alan P.; vonVonno, Nick W.
著者所属（英）	NASA Goddard Space Flight Center
発行日	2010-07-19
言語	eng
内容記述	We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
NASA分類	Avionics and Aircraft Instrumentation
レポートNO	GSFC.CP.4804.2011
権利	Copyright, Distribution as joint owner in the copyright