| タイトル | Effect of Radiation Exposure on the Retention of Commercial NAND Flash Memory |
| 本文（外部サイト） | http://hdl.handle.net/2060/20110013317 |
| 著者（英） | LaBel, K. A.; Seidleck, C. M.; Chen, D.; Friendlich, M.; Oldham, Timothy R.; Carts, M. A. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2011-07-25 |
| 言語 | eng |
| 内容記述 | We have compared the data retention of irradiated commercial NAND flash memories with that of unirradiated controls. Under some circumstanc es, radiation exposure has a significant effect on the retention of f lash memories. |
| NASA分類 | Computer Operations and Hardware |
| レポートNO | GSFC.ABS.4551.2011
GSFC.CPR.4958.2011 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
