| タイトル | Defect Depth Measurement Using White Light Interferometry |
| 本文（外部サイト） | http://hdl.handle.net/2060/20110008328 |
| 著者（英） | Parker, Don; Starr, Stan |
| 著者所属（英） | NASA Dryden Flight Research Center |
| 発行日 | 2009-01-01 |
| 言語 | eng |
| 内容記述 | The objectives of the White Light Interferometry project are the following: (1) Demonstrate a small hand-held instrument capable of performing inspections of identified defects on Orbiter outer pane window surfaces. (2) Build and field-test a prototype device using miniaturized optical components. (3) Modify the instrument based on field testing and begin the conversion of the unit to become a certified shop-aid. |
| NASA分類 | Astronautics (General) |
| レポートNO | KSC-2009-293 |
| 権利 | No Copyright |
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