| タイトル | XPS Protocol for the Characterization of Pristine and Functionalized Single Wall Carbon Nanotubes |
| 本文（外部サイト） | http://hdl.handle.net/2060/20090038728 |
| 著者（英） | Sosa, E. D.; Huffman, C. B.; Allada, R.; Arepalli, S. |
| 著者所属（英） | NASA Johnson Space Center |
| 発行日 | 2009-01-01 |
| 言語 | eng |
| 内容記述 | Recent interest in developing new applications for carbon nanotubes (CNT) has fueled the need to use accurate macroscopic and nanoscopic techniques to characterize and understand their chemistry. X-ray photoelectron spectroscopy (XPS) has proved to be a useful analytical tool for nanoscale surface characterization of materials including carbon nanotubes. Recent nanotechnology research at NASA Johnson Space Center (NASA-JSC) helped to establish a characterization protocol for quality assessment for single wall carbon nanotubes (SWCNTs). Here, a review of some of the major factors of the XPS technique that can influence the quality of analytical data, suggestions for methods to maximize the quality of data obtained by XPS, and the development of a protocol for XPS characterization as a complementary technique for analyzing the purity and surface characteristics of SWCNTs is presented. The XPS protocol is then applied to a number of experiments including impurity analysis and the study of chemical modifications for SWCNTs. |
| NASA分類 | Physics (General) |
| レポートNO | JSC-CN-16923 |
| 権利 | Copyright, Distribution under U.S. Government purpose rights |
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