AIREX: Low-Energy Proton Testing Methodology

タイトル	Low-Energy Proton Testing Methodology
本文（外部サイト）	http://hdl.handle.net/2060/20090027717
著者（英）	Reed, Robert A.; Friendlich, M.R.; Schwank, James R.; Mendenhall, Marcus H.; Shaneyfelt, Marty R.; Kim, Hak S.; Ladbury, Raymond L.; Pellish, Jonathan A.; Weller, Robert A.; Rodbell, Kenneth P.; Phan, Anthony; LaBel, Kenneth A.; Hakey, Mark C.; Marshall, Paul W.; Berg, Melanie; Heidel, David F.; Xapsos, M.A.; Sierawski, B.D.; Dodd, Paul E.
著者所属（英）	NASA Goddard Space Flight Center
発行日	2009-04-20
言語	eng
内容記述	Use of low-energy protons and high-energy light ions is becoming necessary to investigate current-generation SEU thresholds. Systematic errors can dominate measurements made with low-energy protons. Range and energy straggling contribute to systematic error. Low-energy proton testing is not a step-and-repeat process. Low-energy protons and high-energy light ions can be used to measure SEU cross section of single sensitive features; important for simulation.
NASA分類	Electronics and Electrical Engineering
権利	Copyright, Distribution as joint owner in the copyright