| タイトル | Simulation of SRAM SEU Sensitivity at Reduced Operating Temperatures |
| 本文（外部サイト） | http://hdl.handle.net/2060/20090027705 |
| 著者（英） | Sanathanamurthy, S.; Reed, R. A.; Cressler, J. D.; Woods, B.; Turowski, M.; Bellini, M.; Barlow, M.; Sutton, A.; Mantooth, A.; Massengill, L. W.; Moen, K.; Ramachandran, V.; Raman, A.; Alles, M. L. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2009-03-16 |
| 言語 | eng |
| 内容記述 | A new NanoTCAD-to-Spectre interface is applied to perform mixed-mode SEU simulations of an SRAM cell. Results using newly calibrated TCAD cold temperature substrate mobility models, and BSIM3 compact models extracted explicitly for the cold temperature designs, indicate a 33% reduction in SEU threshold for the range of temperatures simulated. |
| NASA分類 | Fluid Mechanics and Thermodynamics |
| 権利 | Copyright, Distribution under U.S. Government purpose rights |
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