| タイトル | Thermal (Silicon Diode) Data Acquisition Systems |
| 本文（外部サイト） | http://hdl.handle.net/2060/20090014728 |
| 著者（英） | Wright, Ernest; Kegley, Jeff |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 2008-10-23 |
| 言語 | eng |
| 内容記述 | Marshall Space Flight Center s X-ray Cryogenic Facility (XRCF) has been performing cryogenic testing to 20 Kelvin since 1999. Two configurations for acquiring data from silicon diode temperature sensors have been implemented at the facility. The facility's environment is recorded via a data acquisition system capable of reading up to 60 silicon diodes. Test article temperature is recorded by a second data acquisition system capable of reading 150+ silicon diodes. The specifications and architecture of both systems will be presented. |
| NASA分類 | Instrumentation and Photography |
| レポートNO | MSFC-2162 |
| 権利 | No Copyright |
