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タイトルDecontaminating Solar Wind Samples with the Genesis Ultra-Pure Water Megasonic Wafer Spin Cleaner
本文(外部サイト)http://hdl.handle.net/2060/20090006792
著者(英)Rodriquez, M. C.; Allton, J. H.; Stansbery, E. K.; Calaway, Michael J.
著者所属(英)NASA Johnson Space Center
発行日2009-01-01
言語eng
内容記述The Genesis sample return capsule, though broken during the landing impact, contained most of the shattered ultra-pure solar wind collectors comprised of silicon and other semiconductor wafers materials. Post-flight analysis revealed that all wafer fragments were littered with surface particle contamination from spacecraft debris as well as soil from the impact site. This particulate contamination interferes with some analyses of solar wind. In early 2005, the Genesis science team decided to investigate methods for removing the surface particle contamination prior to solar wind analysis.
NASA分類Solar Physics
権利Copyright, Distribution as joint owner in the copyright


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