| タイトル | Failure Analysis of Electrical Pin Connectors |
| 本文（外部サイト） | http://hdl.handle.net/2060/20080043565 |
| 著者（英） | Smith, Stephen W.; Herath, Jeffrey A.; Newman, John A.; Baughman, James M. |
| 著者所属（英） | NASA Langley Research Center |
| 発行日 | 2008-10-01 |
| 言語 | eng |
| 内容記述 | A study was initiated to determine the root cause of failure for circuit board electrical connection pins that failed during vibRatory testing. The circuit board is part of an unmanned space probe, and the vibratory testing was performed to ensure component survival of launch loading conditions. The results of this study show that the pins failed as a result of fatigue loading. |
| NASA分類 | Metals and Metallic Materials |
| レポートNO | NASA/TM-2008-215531
L-19544 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
