| タイトル | Toward a Complete Metrological Solution for the Mirrors for the Constellation-X Spectroscopy X-ray Telescope |
| 本文（外部サイト） | http://hdl.handle.net/2060/20080039299 |
| 著者（英） | Zhang, W. W.; Reid, P.; Owens, S.; Chan, K.-W.; Saha, T. T.; Lehan, John; Hadjimichael, T.; Hong, M. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2007-08-26 |
| 言語 | eng |
| 内容記述 | We present an overview update of the metrological approach to be employed for the segmented mirror fabrication for Constellation-X spectroscopy x-ray telescope. We compare results achieved to date with mission requirements. This is discussed in terms of inherent capability versus in-practice capability. |
| NASA分類 | Optics |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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