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タイトルUncertainty and Sensitivity Analyses of a Two-Parameter Impedance Prediction Model
本文(外部サイト)http://hdl.handle.net/2060/20080018590
著者(英)Jones, M. G.; Watson, W. R.; Parrott, T. L.
著者所属(英)NASA Langley Research Center
発行日2008-05-05
言語eng
内容記述This paper presents comparisons of predicted impedance uncertainty limits derived from Monte-Carlo-type simulations with a Two-Parameter (TP) impedance prediction model and measured impedance uncertainty limits based on multiple tests acquired in NASA Langley test rigs. These predicted and measured impedance uncertainty limits are used to evaluate the effects of simultaneous randomization of each input parameter for the impedance prediction and measurement processes. A sensitivity analysis is then used to further evaluate the TP prediction model by varying its input parameters on an individual basis. The variation imposed on the input parameters is based on measurements conducted with multiple tests in the NASA Langley normal incidence and grazing incidence impedance tubes; thus, the input parameters are assigned uncertainties commensurate with those of the measured data. These same measured data are used with the NASA Langley impedance measurement (eduction) processes to determine the corresponding measured impedance uncertainty limits, such that the predicted and measured impedance uncertainty limits (95% confidence intervals) can be compared. The measured reactance 95% confidence intervals encompass the corresponding predicted reactance confidence intervals over the frequency range of interest. The same is true for the confidence intervals of the measured and predicted resistance at near-resonance frequencies, but the predicted resistance confidence intervals are lower than the measured resistance confidence intervals (no overlap) at frequencies away from resonance. A sensitivity analysis indicates the discharge coefficient uncertainty is the major contributor to uncertainty in the predicted impedances for the perforate-over-honeycomb liner used in this study. This insight regarding the relative importance of each input parameter will be used to guide the design of experiments with test rigs currently being brought on-line at NASA Langley.
NASA分類Electronics and Electrical Engineering
権利No Copyright


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