| タイトル | Low Temperature (30 K) TID Test Results of a Radiation Hardened 128 Channel Serial-to-Parallel Converter |
| 本文（外部サイト） | http://hdl.handle.net/2060/20070022224 |
| 著者（英） | Moseley, Harvey; Pearce, Mike; Bloom, Dave; Buchanan, Ernie; Buchner, Stephen; Hait, Tom; Quinn, Ed; Ray, Knute; Meyer, Stephen; Tuttle, Jim; Rapchun, David A. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2006-01-01 |
| 言語 | eng |
| 内容記述 | This viewgraph presentation reviews the low temperature, Total Ionizing Dose (TID) tests of radiation hardened serial to parallel converter to be used on the James Webb Space Telescope. The test results show that the original HV583 level shifter - a COTS part -was not suitable for JWST because the supply currents exceeded specs after 20 krad( Si) .The HV584 - functionally similar to the HV583 -was designed using RHBD approach that reduced the leakage currents to within acceptable levels and had only a small effect on the level-shifted output voltage. |
| NASA分類 | Electronics and Electrical Engineering |
| 権利 | No Copyright |
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