| タイトル | Radiation Characterization of a 0.11 micrometer Modified Commercial CMOS Process |
| 本文（外部サイト） | http://hdl.handle.net/2060/20060027782 |
| 著者（英） | Kim, H.; Mirabedini, M.; Tung, J.; Poivey, C.; Vilchis, M.; LaBel, K.; Forney, J.; Finlinson, R.; Sukharnov, A.; Song, J.; Saigusa, R.; Hornback, V.; Phan, A. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2006-01-01 |
| 言語 | eng |
| 内容記述 | This viewgraph presentation reviews the tests of a modified commercial CMOS chip for operation in radiation environments. The presentation has pictures of the chip, and charts of the test results. |
| NASA分類 | Computer Operations and Hardware |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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