| タイトル | Small Pitch Transition-Edge Sensors with Broadband High Spectral Resolution for Solar Physics |
| 著者（英） | Kelley, R. L.; Porter, F. S.; Eckart, M. E.; Sadleir, J. E.; Bailey, C. N.; Adams, J. S.; Smith, Adams; Chevenak, J. A.; Kilbourne, C. A.; Finkbeiner, F. M.; Bandler, S. R.; Smith, S. J. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2012-02-01 |
| 言語 | eng |
| 内容記述 | We are developing small pitch transition-edge sensor (TES) X-ray detectors optimized for solar astronomy. These devices are fabricated on thick Si substrates with embedded Cu heat-sink layer. We use 35 x 35 square micrometers Mo/Au TESs with 4.5 micrometer thick Au absorbers. We have tested devices with different geometric absorber stem contact areas with the TES and surrounding substrate area. This allows us to investigate the loss of athermal phonons to the substrate. Results show a correlation between thc stem contact area and a broadening in the spectral line shape indicative of athermal phonon loss. When the contact area is minimized we have obtained exceptional broadband spectral resolution of 1.28 plus or minus 0.03 eV at an energy of 1.5 keV, 1.58 plus or minus 0.07 eV at 5.9 keV and 1.96 plus or minus 0.08 eV at 8 keV. The linearity in the measured gain scale is understood in the context of the longitudinal proximity effect from the electrical bias leads resulting in transition characteristics that are strongly dependent upon TES size. |
| NASA分類 | Solar Physics |
| レポートNO | GSFC.JA.7033.2012 |
| 権利 | Copyright |
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