| タイトル | Method and apparatus for mapping the distribution of chemical elements in an extended medium |
| 本文（外部サイト） | http://hdl.handle.net/2060/19850012969 |
| 著者（英） | Trombka, J. I.; Evans, L. G. |
| 著者所属（英） | Computer Sciences Corp.|NASA Goddard Space Flight Center |
| 発行日 | 1984-11-20 |
| 言語 | eng |
| 内容記述 | Contaminants in an extended medium such as the wall of a building are mapped by locating neutron excitation source on one side of the wall and a gamma ray spectrometer, including a gamma ray detector on the opposite side of the wall facing the excitation source. The source and detector are moved in unison in discrete steps over opposing wall surfaces so as to determine the chemical composition of the elements in a hemispheric region of the wall adjacent the detector with the radius of the region being substantially that of the mean free path distance of gamma rays emitted from elements interacting with neutrons on the detector side of the wall. The source and detector are reversed for relatively thick walls for mapping the distribution of elements on the other side of the wall thickness. The output of the detector is fed to a multichannel pulse height analyzer where the intensity of the various gamma ray spectral lines are indicated relative to a dominant constituent element such as silicon. Resolution of anomalies such as the presence of voids and/or determining the bulk density of the medium is achieved by substituting a gamma ray source technique is also applied to metal alloys, such as iron alloys, in either the solid or molten state. |
| NASA分類 | INORGANIC AND PHYSICAL CHEMISTRY |
| レポートNO | 85N21279
NAS 1.71:GSC-12808-1 |
| 権利 | No Copyright |
