| タイトル | Processing Waveform-Based NDE |
| 本文（外部サイト） | http://hdl.handle.net/2060/20110011001 |
| 著者（英） | Roth, Donald J |
| 著者所属（英） | NASA Headquarters |
| 発行日 | 2011-04-26 |
| 言語 | eng |
| 内容記述 | A computer implemented process for simultaneously measuring the velocity of terahertz electromagnetic radiation in a dielectric material sample without prior knowledge of the thickness of the sample and for measuring the thickness of a material sample using terahertz electromagnetic radiation in a material sample without prior knowledge of the velocity of the terahertz electromagnetic radiation in the sample is disclosed and claimed. Utilizing interactive software the process evaluates, in a plurality of locations, the sample for microstructural variations and for thickness variations and maps the microstructural and thickness variations by location. A thin sheet of dielectric material may be used on top of the sample to create a dielectric mismatch. The approximate focal point of the radiation source (transceiver) is initially determined for good measurements. |
| NASA分類 | Quality Assurance and Reliability |
| 権利 | No Copyright |
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