タイトル | The Wide-Field Imaging Interferometry Testbed: Recent Progress |
著者(英) | Rinehart, Stephen A. |
著者所属(英) | NASA Goddard Space Flight Center |
発行日 | 2010-06-27 |
言語 | eng |
内容記述 | The Wide-Field Imaging Interferometry Testbed (WIIT) at NASA's Goddard Space Flight Center was designed to demonstrate the practicality and application of techniques for wide-field spatial-spectral ("double Fourier") interferometry. WIIT is an automated system, and it is now producing substantial amounts of high-quality data from its state-of-the-art operating environment, Goddard's Advanced Interferometry and Metrology Lab. In this paper, we discuss the characterization and operation of the testbed and present the most recent results. We also outline future research directions. A companion paper within this conference discusses the development of new wide-field double Fourier data analysis algorithms. |
NASA分類 | Instrumentation and Photography |
権利 | No Copyright |
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