| タイトル | First On-Wafer Power Characterization of MMIC Amplifiers at Sub-Millimeter Wave Frequencies |
| 著者（英） | Gaier, T.; Yoshida, W.; Uyeda, J.; Samoska, L.; Liu, P. S.; Barsky, M.; Mei, X. B.; Radisic, V.; Fung, A. K.; Lai, R.; Deal, W. R. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 2008-06-06 |
| 言語 | eng |
| 内容記述 | Recent developments in semiconductor technology have enabled advanced submillimeter wave (300 GHz) transistors and circuits. These new high speed components have required new test methods to be developed for characterizing performance, and to provide data for device modeling to improve designs. Current efforts in progressing high frequency testing have resulted in on-wafer-parameter measurements up to approximately 340 GHz and swept frequency vector network analyzer waveguide measurements to 508 GHz. On-wafer noise figure measurements in the 270-340 GHz band have been demonstrated. In this letter we report on on-wafer power measurements at 330 GHz of a three stage amplifier that resulted in a maximum measured output power of 1.78mW and maximum gain of 7.1 dB. The method utilized demonstrates the extension of traditional power measurement techniques to submillimeter wave frequencies, and is suitable for automated testing without packaging for production screening of submillimeter wave circuits. |
| NASA分類 | Electronics and Electrical Engineering |
| 権利 | Copyright |
|
