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タイトルThe Wide-Field Imaging Interferometry Testbed (WIIT): Recent Progress and Results
著者(英)Lyon, Richard G.; Maher, Stephen F.; Leisawitz, David T.; Frey, Bradley J.; Rinehart, Stephen A.; Martino, Anthony J.
著者所属(英)NASA Goddard Space Flight Center
発行日2008-06-23
言語eng
内容記述Continued research with the Wide-Field Imaging Interferometry Testbed (WIIT) has achieved several important milestones. We have moved WIIT into the Advanced Interferometry and Metrology (AIM) Laboratory at Goddard, and have characterized the testbed in this well-controlled environment. The system is now completely automated and we are in the process of acquiring large data sets for analysis. In this paper, we discuss these new developments and outline our future research directions. The WIIT testbed, combined with new data analysis techniques and algorithms, provides a demonstration of the technique of wide-field interferometric imaging, a powerful tool for future space-borne interferometers.
NASA分類Astronomy
レポートNOPaper 7013-100
権利Copyright


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