| タイトル | Commercial Sensory Survey Radiation Testing Progress Report |
| 著者（英） | Alexander, James W.; Becker, Heidi N.; Dolphic, Michael D.; Thorbourn, Dennis O.; Salomon, Phil M. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 2008-04-01 |
| 言語 | eng |
| 内容記述 | The NASA Electronic Parts and Packaging (NEPP) Program Sensor Technology Commercial Sensor Survey task is geared toward benefiting future NASA space missions with low-cost, short-duty-cycle, visible imaging needs. Such applications could include imaging for educational outreach purposes or short surveys of spacecraft, planetary, or lunar surfaces. Under the task, inexpensive commercial grade CMOS sensors were surveyed in fiscal year 2007 (FY07) and three sensors were selected for total ionizing dose (TID) and displacement damage dose (DDD) tolerance testing. The selected sensors had to meet selection criteria chosen to support small, low-mass cameras that produce good resolution color images. These criteria are discussed in detail in [1]. This document discusses the progress of radiation testing on the Micron and OmniVision sensors selected in FY07 for radiation tolerance testing. |
| NASA分類 | Electronics and Electrical Engineering |
| レポートNO | JPL-Publ-08-22 |
| 権利 | Copyright |
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