| タイトル | Sub-nanometer Level Model Validation of the SIM Interferometer |
| 著者（英） | Wang, Xu; Korechoff, Robert P.; Hoppe, Daniel |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 2004-06-21 |
| 言語 | eng |
| 内容記述 | The Space Interferometer Mission (SIM) flight instrument will not undergo a full performance, end-to-end system test on the ground due to a number of constraints. Thus, analysis and physics-based models will play a significant role in providing confidence that SIM will meet its science goals on orbit. The various models themselves are validated against the experimental results obtained from the MicroArcsecond Metrology (MAM) testbed adn the Diffraction testbed (DTB). The metric for validation is provided by the SIM astrometric error budget. |
| NASA分類 | Spacecraft Instrumentation and Astrionics |
| 権利 | Copyright |
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