| タイトル | Electron-Induced Displacement Damage Effects in CCDs |
| 著者（英） | Elliott, Tom; Becker, Heidi N.; Alexander, James W. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 2006-07-17 |
| 言語 | eng |
| 内容記述 | We compare differences in parametric degradation for CCDs irradiated to the same displacement damage dose with 10-MeV and 50-MeV electrons. Charge transfer efficiency degradation was observed to not scale with NIEL for small signals. |
| NASA分類 | Space Radiation |
| 権利 | Copyright |
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