| タイトル | Absolute optical metrology : nanometers to kilometers |
| 著者（英） | Dubovitsky, Serge; Peters, R. D.; Liebe, C. C.; Lay, O. P. |
| 発行日 | 2005-07-11 |
| 言語 | eng |
| 内容記述 | We provide and overview of the developments in the field of high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor. |
| 権利 | Copyright |
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