| タイトル | Silicon Detector Studies with an Interferometric Thickness Mapper |
| 著者（英） | Milliken, B.; Leske, R. A.; Wiedenbeck, M. E. |
| 発行日 | 1995-08-01 |
| 言語 | eng |
| 内容記述 | Cosmic ray isotopic composition studies aboard satellites are normally based on energy detection measurements which require a precise knowledge of matter thickness particle penetration. A laser- interferometer system has been developed to precisely map the thick- ness variations of large-area silicon detectors. Design, operation, and the data processing to derive thickness maps is described. |
| 権利 | Copyright |
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