| タイトル | Trends in Device SEE Susceptibility from Heavy Ions |
| 著者（英） | Nichols, D. K.; Swift, G. M.; Hansel, S. J.; Watson, R. K.; McCarty, K. P.; Crain, W. R.; Crawford, K. B.; Coss, J. R.; Schwartz, H. R.; Koga, R. |
| 発行日 | 1995-07-01 |
| 言語 | eng |
| 内容記述 | The sixth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications in December issues of IEEE - Nuclear Science Transactions for 1985, 1987, 1989, 1991, and the IEEE Workshop Record, 1993. Trends in SEE susceptibility (including soft errors and latchup) for state-of- are evaluated. |
| 権利 | Copyright |
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