| タイトル | Accelerated Lifetime Testing and Failure Analysis of Quartz Based GaAs Planar Schottky Diodes |
| 著者（英） | Humphrey, D.; Mehdi, I.; Kayali, S.; Lee, T.; Lin, R.; Pease, A.; Scherer, A.; Dengler, R. |
| 発行日 | 1997-10-12 |
| 言語 | eng |
| 内容記述 | Accelerated lifetime tests have been performed on intergrated planar GaAs Schottky diodes that were bonded to quartz substrates up-side-down with a heat-cured epoxy. |
| NASA分類 | Electronics and Electrical Engineering |
| 権利 | Copyright |
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