タイトル | High Resolution EUV Emission Spectroscopy of The N2c'v' = 3 and 4 Levels by Electron Impact |
著者(英) | Ajello, Joseph M. |
発行日 | 1997-10-01 |
言語 | eng |
内容記述 | The rotational line structure of the band system has been studied by a variety of techniques. |
権利 | Copyright |
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