| タイトル | Device See Susceptibility From Heavy Ions (1995-1996) |
| 著者（英） | Koga, R.; Penzin, S. H.; Schwartz, H. R.; Nichols, D. K.; Crain, W. R.; Miyahira, T. F.; Swift, G. M.; Coss, J. R.; Crawford, K. B. |
| 発行日 | 1997-07-21 |
| 言語 | eng |
| 内容記述 | A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs. |
| 権利 | Copyright |
|
