タイトル | Processing of Superconductor-Normal-Superconductor Josephson Edge Junctions |
著者(英) | Kleinsasser, A. W.; Barner, J. B. |
発行日 | 1997-12-01 |
言語 | eng |
内容記述 | The electrical behavior of epitaxial superconductor-normal-superconductor (SNS) Josephson edge junctions is strongly affected by processing conditions. Ex-situ processes, utilizing photoresist and polyimide/photoresist mask layers, are employed for ion milling edges for junctions with Yttrium-Barium-Copper-Oxide (YBCO) electrodes and primarily Co-doped YBCO interlayers. |
権利 | Copyright |
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