| タイトル | Picometer knowledge transfer: overview and status |
| 著者（英） | Ames, L.; Oseas, J. M.; Schaechter, D.; Nordt, A. |
| 発行日 | 2003-03-01 |
| 言語 | eng |
| 内容記述 | The Picometer Knowledge Transfer testbed is one of several technology testbeds that will help to prove technology readiness for the Space Interferometry Mission (SIM). |
| NASA分類 | Instrumentation and Photography |
| 権利 | Copyright |
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