| タイトル | A reliability evaluation methodology for memory chips for space applications when sample size is small |
| 著者（英） | Nguyen, D.; Guertin, S.; Menke, R.; Kayali, S.; Chen, Y.; White, M.; Berstein, J. |
| 発行日 | 2003-10-20 |
| 言語 | eng |
| 内容記述 | This paper presents a reliability evaluation methodology to obtain the statistical reliability information of memory chips for space applications when the test sample size needs to be kept small because of the high cost of the radiation hardness memories. |
| 権利 | Copyright |
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